@misc{indiciae31b947bfa8ae,
  title = {Intrinsic origin of electron scattering at 4H-SiC(0001)/SiO\$\_2\$},
  author = {Shigeru Iwase and Christopher James Kirkham and Tomoya Ono},
  year = {2016},
  doi = {10.1103/physrevb.95.041302},
  url = {https://arxiv.org/abs/1607.04399},
  note = {Source identifier: 1607.04399}
}