TY  - RPRT
TI  - Intrinsic origin of electron scattering at 4H-SiC(0001)/SiO$_2$
AU  - Shigeru Iwase
AU  - Christopher James Kirkham
AU  - Tomoya Ono
PY  - 2016
DO  - 10.1103/physrevb.95.041302
UR  - https://arxiv.org/abs/1607.04399
ID  - 1607.04399
ER  -