@misc{indiciaed722a628ee1f,
  title = {A comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures},
  author = {K. Ganesan and Subrata Ghosh and Nanda Gopala Krishna and S. Ilango and M. Kamruddin and A. K. Tyagi},
  year = {2016},
  doi = {10.1039/c6cp02033j},
  url = {https://arxiv.org/abs/1607.04482},
  note = {Source identifier: 1607.04482}
}