TY  - RPRT
TI  - A comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures
AU  - K. Ganesan
AU  - Subrata Ghosh
AU  - Nanda Gopala Krishna
AU  - S. Ilango
AU  - M. Kamruddin
AU  - A. K. Tyagi
PY  - 2016
DO  - 10.1039/c6cp02033j
UR  - https://arxiv.org/abs/1607.04482
ID  - 1607.04482
ER  -