TY  - RPRT
TI  - DiaSys: Improving SoC Insight Through On-Chip Diagnosis
AU  - Philipp Wagner
AU  - Thomas Wild
AU  - Andreas Herkersdorf
PY  - 2017
DO  - 10.1016/j.sysarc.2017.01.005
UR  - https://arxiv.org/abs/1607.04549
ID  - 1607.04549
ER  -