TY  - RPRT
TI  - Impact of Edge States on Device Performance of Phosphorene Heterojunction Tunneling Field Effect Transistors
AU  - Fei Liu
AU  - Jian Wang
AU  - Hong Guo
PY  - 2016
DO  - 10.1039/c6nr05734a
UR  - https://arxiv.org/abs/1607.05105
ID  - 1607.05105
ER  -