TY  - RPRT
TI  - Determination of the thickness and orientation of few-layer tungsten ditelluride using polarized Raman spectroscopy
AU  - Minjung Kim
AU  - Songhee Han
AU  - Jung Hwa Kim
AU  - Jae-Ung Lee
AU  - Zonghoon Lee
AU  - Hyeonsik Cheong
PY  - 2016
DO  - 10.1088/2053-1583/3/3/034004
UR  - https://arxiv.org/abs/1608.03777
ID  - 1608.03777
ER  -