TY  - RPRT
TI  - Pinning-depinning mechanism of the contact line during evaporation on chemically patterned surfaces: A lattice Boltzmann study
AU  - Qing Li
AU  - P. Zhou
AU  - H. J. Yan
PY  - 2016
DO  - 10.1021/acs.langmuir.6b01490
UR  - https://arxiv.org/abs/1609.00182
ID  - 1609.00182
ER  -