@misc{indiciaeb35732fa1bff,
  title = {Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy},
  author = {E. Vittone and Z. Pastuovic and P. Olivero and C. Manfredotti and M. Jaksic and A. Lo Giudice and F. Fizzotti and E. Colombo},
  year = {2016},
  doi = {10.1016/j.nimb.2007.12.083},
  url = {https://arxiv.org/abs/1609.00236},
  note = {Source identifier: 1609.00236}
}