TY  - RPRT
TI  - High-Dimensional Disorder-Driven Phenomena in Weyl Semimetals, Semiconductors and Related Systems
AU  - S. V. Syzranov
AU  - L. Radzihovsky
PY  - 2017
UR  - https://arxiv.org/abs/1609.05694
ID  - 1609.05694
ER  -