TY  - RPRT
TI  - Buttiker Probe Based Modeling of TDDB: Application to Dielectric Breakdown in MTJs and MOS Devices
AU  - Ahmed Kamal Reza
AU  - Mohammad Khaled Hassan
AU  - Kaushik Roy
PY  - 2017
UR  - https://arxiv.org/abs/1609.05919
ID  - 1609.05919
ER  -