TY  - RPRT
TI  - Effect of strain, thickness, and local surface environment on electron transport properties of oxygen-terminated copper thin films
AU  - Alfonso Sanchez-Soares
AU  - Sarah L. T. Jones
AU  - John J. Plombon
AU  - Ananth P. Kaushik
AU  - Roger E. Nagle
AU  - James S. Clarke
AU  - James C. Greer
PY  - 2016
DO  - 10.1103/physrevb.94.155404
UR  - https://arxiv.org/abs/1609.06150
ID  - 1609.06150
ER  -