TY  - RPRT
TI  - Performance degradation of superlattice MOSFETs due to scattering in the contacts
AU  - Pengyu Long
AU  - Jun Huang
AU  - Zhengping Jiang
AU  - Gerhard Klimeck
AU  - Mark J. W. Rodwell
AU  - Michael Povolotskyi
PY  - 2016
DO  - 10.1063/1.4971341
UR  - https://arxiv.org/abs/1609.07203
ID  - 1609.07203
ER  -