TY  - RPRT
TI  - An integrated and multi-purpose microscope for the characterization of atomically thin optoelectronic devices
AU  - Adolfo De Sanctis
AU  - Gareth F. Jones
AU  - Nicola J. Townsend
AU  - Monica F. Craciun
AU  - Saverio Russo
PY  - 2017
DO  - 10.1063/1.4982358
UR  - https://arxiv.org/abs/1609.07514
ID  - 1609.07514
ER  -