TY  - RPRT
TI  - Realistic inversion of diffraction data for an amorphous solid: the case of amorphous silicon
AU  - Anup Pandey
AU  - Parthapratim Biswas
AU  - Bishal Bhattarai
AU  - D. A. Drabold
PY  - 2016
DO  - 10.1103/physrevb.94.235208
UR  - https://arxiv.org/abs/1610.00065
ID  - 1610.00065
ER  -