TY  - RPRT
TI  - Surface Conductivity of Si(100) and Ge(100) Surfaces Determined from Four-Point Transport Measurements Using an Analytical N-Layer Conductance Model
AU  - Sven Just
AU  - Helmut Soltner
AU  - Stefan Korte
AU  - Vasily Cherepanov
AU  - Bert Voigtländer
PY  - 2016
DO  - 10.1103/physrevb.95.075310
UR  - https://arxiv.org/abs/1610.02239
ID  - 1610.02239
ER  -