@misc{indiciaea6a75bc15ec6,
  title = {Measurement Error in Atomic-Scale STEM-EDS Mapping of a Model Oxide Interface},
  author = {Steven R. Spurgeon and Yingge Du and Scott A. Chambers},
  year = {2017},
  doi = {10.1017/s1431927617000368},
  url = {https://arxiv.org/abs/1610.03432},
  note = {Source identifier: 1610.03432}
}