TY  - RPRT
TI  - Polarization-mediated Debye-screening of surface potential fluctuations in dual-channel AlN/GaN high electron mobility transistors
AU  - David A. Deen
AU  - Ross Miller
AU  - Andrei Osinsky
AU  - Brian P. Downey
AU  - David F. Storm
AU  - David J. Meyer
AU  - D. Scott Katzer
AU  - Neeraj Nepal
PY  - 2016
DO  - 10.1063/1.4972225
UR  - https://arxiv.org/abs/1610.03921
ID  - 1610.03921
ER  -