TY  - RPRT
TI  - Elastic measurements of amorphous silicon films at mK temperatures
AU  - Andrew Fefferman
AU  - Ana Maldonado
AU  - Eddy Collin
AU  - Xiao Liu
AU  - Tom Metcalf
AU  - Glenn Jernigan
PY  - 2016
DO  - 10.1007/s10909-016-1686-6
UR  - https://arxiv.org/abs/1610.06778
ID  - 1610.06778
ER  -