TY  - RPRT
TI  - Characterization methods dedicated to nanometer-thick hBN layers
AU  - Leonard Schue
AU  - Ingrid Stenger
AU  - Frederic Fossard
AU  - Annick Loiseau
AU  - Julien Barjon
PY  - 2016
UR  - https://arxiv.org/abs/1610.06858
ID  - 1610.06858
ER  -