TY  - RPRT
TI  - First principles study of band line up at defective metal-oxide interface: oxygen point defects at Al/SiO_2 interface
AU  - Eric Tea
AU  - Jianqiu Huang
AU  - Celine Hin
PY  - 2016
DO  - 10.1088/0022-3727/49/9/095304
UR  - https://arxiv.org/abs/1610.08550
ID  - 1610.08550
ER  -