TY  - RPRT
TI  - Characteristics of Interlayer Tunneling Field Effect Transistors Computed by a "DFT-Bardeen" Method
AU  - Jun Li
AU  - Yifan Nie
AU  - Kyeongjae Cho
AU  - Randall M. Feenstra
PY  - 2016
DO  - 10.1007/s11664-016-5120-2
UR  - https://arxiv.org/abs/1610.09695
ID  - 1610.09695
ER  -