TY  - RPRT
TI  - Universal stability of two-dimensional traditional semiconductors
AU  - Michael C. Lucking
AU  - Weiyu Xie
AU  - Duk-Hyun Choe
AU  - Damien West
AU  - Toh-Ming Lu
AU  - S. B. Zhang
PY  - 2016
DO  - 10.1103/physrevlett.120.086101
UR  - https://arxiv.org/abs/1611.00121
ID  - 1611.00121
ER  -