TY  - RPRT
TI  - Second-harmonic generation as probe for structural and electronic properties of buried GaP/Si(001) interfaces
AU  - K. Brixius
AU  - A. Beyer
AU  - J. Güdde
AU  - M. Dürr
AU  - W. Stolz
AU  - K. Volz
AU  - U. Höfer
PY  - 2018
DO  - 10.1088/1361-648x/aae85b
UR  - https://arxiv.org/abs/1611.01307
ID  - 1611.01307
ER  -