TY  - RPRT
TI  - Characterization of hexagonal boron nitride layers on nickel surfaces by low-energy electron microscopy
AU  - P. C. Mende
AU  - Q. Gao
AU  - A. Ismach
AU  - H. Chou
AU  - M. Widom
AU  - R. Ruoff
AU  - L. Colombo
AU  - R. M. Feenstra
PY  - 2017
DO  - 10.1016/j.susc.2017.02.004
UR  - https://arxiv.org/abs/1611.04844
ID  - 1611.04844
ER  -