@misc{indiciae119993b93d7f,
  title = {Strain in epitaxial MnSi films on Si(111) in the thick film limit studied by polarization-dependent extended x-ray absorption fine structure},
  author = {A. I. Figueroa and S. L. Zhang and A. A. Baker and R. Chalasani and A. Kohn and S. C. Speller and D. Gianolio and C. Pfleiderer and G. van der Laan and T. Hesjedal},
  year = {2016},
  doi = {10.1103/physrevb.94.174107},
  url = {https://arxiv.org/abs/1611.07736},
  note = {Source identifier: 1611.07736}
}