TY  - RPRT
TI  - Strain in epitaxial MnSi films on Si(111) in the thick film limit studied by polarization-dependent extended x-ray absorption fine structure
AU  - A. I. Figueroa
AU  - S. L. Zhang
AU  - A. A. Baker
AU  - R. Chalasani
AU  - A. Kohn
AU  - S. C. Speller
AU  - D. Gianolio
AU  - C. Pfleiderer
AU  - G. van der Laan
AU  - T. Hesjedal
PY  - 2016
DO  - 10.1103/physrevb.94.174107
UR  - https://arxiv.org/abs/1611.07736
ID  - 1611.07736
ER  -