TY  - RPRT
TI  - Understanding different efficiency droop behaviors in InGaN-based near-UV, blue and green light-emitting diodes through differential carrier lifetime measurements
AU  - Lai Wang
AU  - Xiao Meng
AU  - Jiaxing Wang
AU  - Zhibiao Hao
AU  - Yi Luo
AU  - Changzheng Sun
AU  - Yanjun Han
AU  - Bing Xiong
AU  - Jian Wang
AU  - Hongtao Li
PY  - 2016
UR  - https://arxiv.org/abs/1611.07972
ID  - 1611.07972
ER  -