@misc{indiciae9137f2d87585,
  title = {Nondestructive method of thin film dielectric constant measurements by two-wire capacitor},
  author = {Svitlana Kondovych and Igor Luk'yanchuk},
  year = {2016},
  doi = {10.1002/pssb.201600476},
  url = {https://arxiv.org/abs/1611.08851},
  note = {Source identifier: 1611.08851}
}