TY  - RPRT
TI  - Nondestructive method of thin film dielectric constant measurements by two-wire capacitor
AU  - Svitlana Kondovych
AU  - Igor Luk'yanchuk
PY  - 2016
DO  - 10.1002/pssb.201600476
UR  - https://arxiv.org/abs/1611.08851
ID  - 1611.08851
ER  -