@misc{indiciae840abe235d41,
  title = {Measurements and TCAD Simulations of Bulk and Surface Radiation Damage Effects in Silicon Detectors},
  author = {F. Moscatelli and P. Maccagnani and D. Passeri and G. M. Bilei and L. Servoli and A. Morozzi and G. -F. Dalla Betta and R. Mendicino and M. Boscardin and N. Zorzi},
  year = {2016},
  doi = {10.1109/nssmic.2015.7581944},
  url = {https://arxiv.org/abs/1611.10132},
  note = {Source identifier: 1611.10132}
}