@misc{indiciaeaf6b2a34d849,
  title = {Combined Bulk and Surface Radiation Damage Effects at Very High Fluences in Silicon Detectors: Measurements and TCAD Simulations},
  author = {F. Moscatelli and D. Passeri and A. Morozzi and Roberto Mendicino and G. -F. Dalla Betta and G. M. Bilei},
  year = {2016},
  doi = {10.1109/tns.2016.2599560},
  url = {https://arxiv.org/abs/1611.10138},
  note = {Source identifier: 1611.10138}
}