TY  - RPRT
TI  - Combined Bulk and Surface Radiation Damage Effects at Very High Fluences in Silicon Detectors: Measurements and TCAD Simulations
AU  - F. Moscatelli
AU  - D. Passeri
AU  - A. Morozzi
AU  - Roberto Mendicino
AU  - G. -F. Dalla Betta
AU  - G. M. Bilei
PY  - 2016
DO  - 10.1109/tns.2016.2599560
UR  - https://arxiv.org/abs/1611.10138
ID  - 1611.10138
ER  -