TY  - RPRT
TI  - Large phase relaxation length in the topological surface states of epitaxial Bi2-xSnxTe3 thin films
AU  - Seong Won Cho
AU  - Kwang-Chon Kim
AU  - Seong Keun Kim
AU  - Byung-ki Cheong
AU  - Jin-Sang Kim
AU  - Suyoun Lee
PY  - 2016
UR  - https://arxiv.org/abs/1612.03986
ID  - 1612.03986
ER  -