TY  - RPRT
TI  - Evidence of Silicon Band-Edge Emission Enhancement When Interfaced with SiO$_{2}$:Er Films
AU  - S. Abedrabbo
AU  - A. T. Fiory
AU  - N. M. Ravindra
PY  - 2016
DO  - 10.1007/s11837-016-2207-4
UR  - https://arxiv.org/abs/1612.05147
ID  - 1612.05147
ER  -