TY  - RPRT
TI  - A Modified Theoretical Model to Predict the Thermal Interface Conductance Considering Interface Roughness
AU  - Yingying Zhang
AU  - Dengke Ma
AU  - Yi Zang
AU  - Nuo Yang
PY  - 2016
DO  - 10.3389/fenrg.2018.00048
UR  - https://arxiv.org/abs/1612.05357
ID  - 1612.05357
ER  -