@misc{indiciae252b5cf5eb46,
  title = {Experimental detection of active defects in few layers MoS2 through random telegraphic signals analysis observed in its FET characteristics},
  author = {Nan Fang and Kosuke Nagashio and Akira Toriumi},
  year = {2016},
  doi = {10.1088/2053-1583/aa50c4},
  url = {https://arxiv.org/abs/1612.07556},
  note = {Source identifier: 1612.07556}
}