TY  - RPRT
TI  - Experimental detection of active defects in few layers MoS2 through random telegraphic signals analysis observed in its FET characteristics
AU  - Nan Fang
AU  - Kosuke Nagashio
AU  - Akira Toriumi
PY  - 2016
DO  - 10.1088/2053-1583/aa50c4
UR  - https://arxiv.org/abs/1612.07556
ID  - 1612.07556
ER  -