@misc{indiciae0841a9a6ad53,
  title = {Comparison of device structures for the dielectric breakdown measurement of hexagonal boron nitride},
  author = {Yoshiaki Hattori and Takashi Taniguchi and Kenji Watanabe and Kosuke Nagashio},
  year = {2016},
  doi = {10.1063/1.4972555},
  url = {https://arxiv.org/abs/1612.07557},
  note = {Source identifier: 1612.07557}
}