TY  - RPRT
TI  - Comparison of device structures for the dielectric breakdown measurement of hexagonal boron nitride
AU  - Yoshiaki Hattori
AU  - Takashi Taniguchi
AU  - Kenji Watanabe
AU  - Kosuke Nagashio
PY  - 2016
DO  - 10.1063/1.4972555
UR  - https://arxiv.org/abs/1612.07557
ID  - 1612.07557
ER  -