@misc{indiciaee2eb25b828a6,
  title = {Nanoscale characterization of bismuth telluride epitaxic layers by advanced X-ray analysis},
  author = {Sérgio L. Morelhão and Celso I. Fornari and Paulo H. O. Rappl and Eduardo Abramof},
  year = {2016},
  url = {https://arxiv.org/abs/1612.09386},
  note = {Source identifier: 1612.09386}
}