TY  - RPRT
TI  - Nanoscale characterization of bismuth telluride epitaxic layers by advanced X-ray analysis
AU  - Sérgio L. Morelhão
AU  - Celso I. Fornari
AU  - Paulo H. O. Rappl
AU  - Eduardo Abramof
PY  - 2016
UR  - https://arxiv.org/abs/1612.09386
ID  - 1612.09386
ER  -