@misc{indiciaebf72f22631ee,
  title = {AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool},
  author = {Vasili K. Semenov and Yuri A. Polyakov and Sergey K. Tolpygo},
  year = {2016},
  doi = {10.1109/tasc.2017.2669585},
  url = {https://arxiv.org/abs/1701.03837},
  note = {Source identifier: 1701.03837}
}