TY  - RPRT
TI  - AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool
AU  - Vasili K. Semenov
AU  - Yuri A. Polyakov
AU  - Sergey K. Tolpygo
PY  - 2016
DO  - 10.1109/tasc.2017.2669585
UR  - https://arxiv.org/abs/1701.03837
ID  - 1701.03837
ER  -