TY  - RPRT
TI  - Characterization for stability in planar conductivities
AU  - Daniel Faraco
AU  - Martí Prats
PY  - 2017
DO  - 10.1016/j.jde.2018.01.013
UR  - https://arxiv.org/abs/1701.06480
ID  - 1701.06480
ER  -