TY  - RPRT
TI  - Temperature Dependence of the Yield Strength of Aluminum Thin Films: Multiscale Modeling Approach
AU  - Kamyar Davoudi
PY  - 2017
DO  - 10.1016/j.scriptamat.2016.12.039
UR  - https://arxiv.org/abs/1701.07595
ID  - 1701.07595
ER  -