TY  - RPRT
TI  - Parallel Critical Field in Thin Niobium Films: Comparison to Theory
AU  - P. R. Broussard
PY  - 2017
DO  - 10.1007/s10909-017-1792-0
UR  - https://arxiv.org/abs/1701.08745
ID  - 1701.08745
ER  -