@misc{indiciae9515455b1381,
  title = {A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images},
  author = {Ye Tian and Ranjan Maitra and William Q. Meeker and Stephen D. Holland},
  year = {2017},
  doi = {10.1080/00401706.2016.1153000},
  url = {https://arxiv.org/abs/1702.00099},
  note = {Source identifier: 1702.00099}
}