TY  - RPRT
TI  - Relative Permittivity in the Electrical Double Layer from Nonlinear Optics
AU  - Mavis D. Boamah
AU  - Paul E. Ohno
AU  - Franz M. Geiger
AU  - Kenneth B. Eisenthal
PY  - 2017
DO  - 10.1063/1.5011977
UR  - https://arxiv.org/abs/1702.02496
ID  - 1702.02496
ER  -