TY  - RPRT
TI  - Compact Modeling of MOSFET I-V Characteristics and Simulation of Dose-Dependent Drain Currents
AU  - G. I. Zebrev
AU  - V. V. Orlov
AU  - A. S. Bakerenkov
AU  - V. A. Felitsyn
PY  - 2017
UR  - https://arxiv.org/abs/1702.06454
ID  - 1702.06454
ER  -